(PhD in Electronic Engineering)

•    UVM Concepts and Architecture
•    UVM Sequences and Phasing
•    UVM TLM2 and Register Package
•    Putting Together UVM Testbenches

•    Introduction to the production test for ASIC Design for Testability
•    Automatic Test Equipment and Test Program
•    Silicon defects and the Stuck at defect models
•    Algorithm for detecting faults
•    Scan Chain Inside the Automatic Test Equipment
•    Boundary scan
•    Advanced DFT issues
•    Other defect models
•    RAM fault models
•    Conclusions